Quality:

Bead probe technology - technique used for in-circuit testing. Article “Bead probe technology” in English Wikipedia has 31.3 points for quality (as of July 1, 2025).
The article contains 8 references and 6 sections.
Since the creation of article “Bead probe technology”, its content was written by 16 registered users of English Wikipedia and edited by 16 registered Wikipedia users in all languages.
The article is cited 2 times in English Wikipedia and cited 2 times in all languages.
The highest Authors Interest rank from 2001:
- Local (English): #108443 in October 2007
- Global: #280267 in October 2007
The highest popularity rank from 2008:
- Local (English): #967585 in March 2008
- Global: #1590595 in March 2008
There is 1 language version for this article in the WikiRank database (of the considered 55 Wikipedia language editions).
The quality and popularity assessment was based on Wikipédia dumps from July 1, 2025 (including revision history and pageviews for previous years).